Reading memory cells
AssigneeMacronix International Co., Ltd.
InventorsChun Hsiung Hung, Han Sung Chen, Ming Chao Lin
Life of this patent
Estimating the term…
Loading patent…
AssigneeMacronix International Co., Ltd.
InventorsChun Hsiung Hung, Han Sung Chen, Ming Chao Lin
Estimating the term…
A first read operation is performed using a first voltage level to read data from a memory array. An instant bit count corresponding to a number of bits in the data read from the memory array is determined. A recorded bit count corresponding to a number of bits in the data that was written at a time of writing the data to the memory array is accessed. A difference between the instant bit count and the recorded bit count is obtained. Conditioned on determining that the difference is less than or equal to a first threshold value, the data read from the memory array is output using the first read operation. Conditioned on determining that the difference is greater than the first threshold value, a second read operation is performed using a second voltage level that is distinct from the first voltage level.
A method comprising:
A memory device comprising:
A method comprising:
A memory device comprising:
Dependencies are inferred from the claim text.