Video overlay
AssigneeSynopsys, Inc.
InventorAnkush Bharati Oberai
Life of this patent
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Abstract
A method includes automatically aligning a laser-based timing analysis image of a semiconductor device with an image of a layout of the device. The method further includes controlling a speed at which a multitude of images subsequently obtained by the laser-based timing analysis are compared to the layout of the device to create a video overlay. The method further includes analyzing a multitude of potential failures of the semiconductor device by detecting movements of a multitude of hotspots on the layout as shown by the video overlay.
Claims20
A method comprising:
- automatically aligning a laser-based timing analysis image of a semiconductor device with an image of a layout of the device;
- controlling a speed at which a plurality of images subsequently obtained by the laser-based timing analysis are compared to the layout of the device to create a video overlay, said laser-based timing analysis being performed using a laser-assisted device alteration (LADA) technique;
- and
- analyzing a plurality of potential failures of the semiconductor device by detecting movements of a plurality of hotspots on the layout as shown by the video overlay.
A system for identifying a plurality of potential failures of a semiconductor device, the system configured to:
- automatically align a laser-based timing analysis image of the semiconductor device with an image of a layout of the device;
- control a speed at which a plurality of images subsequently obtained by the laser-based timing analysis are compared to the layout of the device to create a video overlay, wherein said laser-based timing analysis is performed using a laser-assisted device alteration (LADA) technique;
- and
- analyze a plurality of potential failures of the semiconductor device by detecting movements of a plurality of hotspots on the layout as shown by the video overlay.
Dependencies are inferred from the claim text.