Single layer sensor array scan

An input device comprising:

• a sensor array comprising a plurality of sensor electrodes in a single layer of the input device, wherein each sensor electrode of the plurality of sensor electrodes is bordered by one or more bordering sensor electrodes of the plurality of sensor electrodes;
• a plurality of routing traces arranged in the single layer;
• and
• a processing system coupled with the plurality of sensor electrodes via the plurality of routing traces, the processing system configured to perform a scan of the sensor array by operating each sensor electrode of the plurality of sensor electrodes to:
• acquire, during a first period, an absolute capacitive measurement for the sensor electrode;
• for each bordering sensor electrode of the one or more bordering sensor electrodes:
• acquire, during a second period, a transcapacitive measurement between the sensor electrode and the bordering sensor electrode;
• and
• according to a predefined sequence:
• drive first sensor electrodes of the plurality of sensor electrodes with a modulated signal during a first sub-period of the second period;
• drive second sensor electrodes of the plurality of sensor electrodes with a modulated signal during a second sub-period of the second period;
• and
• perform one or more matrix operations to acquire the transcapacitive measurement between the sensor electrode and the bordering sensor electrode.

A processing system comprising:

• sensing circuitry configured to:
• couple with a sensor array via a plurality of routing traces, wherein the sensor array comprises a plurality of sensor electrodes in a single layer, wherein each sensor electrode of the plurality of sensor electrodes is bordered by one or more bordering sensor electrodes of the plurality of sensor electrodes, wherein the plurality of routing traces is arranged in the single layer;
• perform a scan of the sensor array by operating each sensor electrode of the plurality of sensor electrodes to:
• acquire, during a first period, an absolute capacitive measurement for the sensor electrode;
• and
• for each bordering sensor electrode of the one or more bordering sensor electrodes:
• acquire, during a second period, a transcapacitive measurement between the sensor electrode and the bordering sensor electrode;
• and
• according to a predefined sequence:
• drive a first plurality of transmitter groups with a modulated signal during a first sub-period of the second period, wherein each transmitter group of the first plurality of transmitter groups comprises a plurality of contiguous sensor electrodes of the plurality of sensor electrodes and is spaced apart from other transmitter groups of the first plurality of transmitter groups;
• and
• drive a second plurality of transmitter groups with a modulated signal during a second sub-period of the second period, wherein each transmitter group of the second plurality of transmitter groups comprises a plurality of contiguous sensor electrodes of the plurality of sensor electrodes and is spaced apart from other transmitter groups of the second plurality of transmitter groups.

A processing system comprising:

• sensing circuitry configured to:
• couple with a sensor array via a plurality of routing traces, wherein the sensor array comprises a plurality of sensor electrodes in a single layer, wherein each sensor electrode of the plurality of sensor electrodes is bordered by one or more bordering sensor electrodes of the plurality of sensor electrodes, wherein the plurality of routing traces is arranged in the single layer;
• perform a scan of the sensor array by operating each sensor electrode of the plurality of sensor electrodes to:
• acquire, during a first period, an absolute capacitive measurement for the sensor electrode;
• and
• for each bordering sensor electrode of the one or more bordering sensor electrodes:
• acquire, during a second period, a transcapacitive measurement between the sensor electrode and the bordering sensor electrode;
• and
• according to a predefined sequence:
• drive first sensor electrodes of the plurality of sensor electrodes with a modulated signal during a first sub-period of the second period;
• drive second sensor electrodes of the plurality of sensor electrodes with a modulated signal during a second sub-period of the second period;
• and
• perform one or more matrix operations to acquire the transcapacitive measurement between the sensor electrode and the bordering sensor electrode.

A method of performing a scan of a sensor array of an input device, the sensor array comprising a plurality of sensor electrodes in a single layer of the input device, the input device further comprising a plurality of routing traces arranged in the single layer, the method comprising:

• for each sensor electrode of the plurality of sensor electrodes:
• acquiring, during a first period, an absolute capacitive measurement for the sensor electrode;
• and
• for each bordering sensor electrode of one or more bordering sensor electrodes of the plurality of sensor electrodes:
• acquiring, during a second period, a transcapacitive measurement between the sensor electrode and the bordering sensor electrode;
• wherein acquiring the transcapacitive measurement comprises, according to a predefined sequence:
• driving a first plurality of transmitter groups with a modulated signal during a first sub-period of the second period, wherein each transmitter group of the first plurality of transmitter groups comprises a plurality of contiguous sensor electrodes of the plurality of sensor electrodes and is spaced apart from other transmitter groups of the first plurality of transmitter groups;
• and
• driving a second plurality of transmitter groups with a modulated signal during a second sub-period of the second period, wherein each transmitter group of the second plurality of transmitter groups comprises a plurality of contiguous sensor electrodes of the plurality of sensor electrodes and is spaced apart from other transmitter groups of the second plurality of transmitter groups.

A method of performing a scan of a sensor array of an input device, the sensor array comprising a plurality of sensor electrodes in a single layer of the input device, the input device further comprising a plurality of routing traces arranged in the single layer, the method comprising:

• for each sensor electrode of the plurality of sensor electrodes:
• acquiring, during a first period, an absolute capacitive measurement for the sensor electrode;
• and
• for each bordering sensor electrode of one or more bordering sensor electrodes of the plurality of sensor electrodes:
• acquiring, during a second period, a transcapacitive measurement between the sensor electrode and the bordering sensor electrode,
• wherein acquiring the transcapacitive measurement comprises, according to a predefined sequence:
• driving first sensor electrodes of the plurality of sensor electrodes with a modulated signal during a first sub-period of the second period;
• driving second sensor electrodes of the plurality of sensor electrodes with a modulated signal during a second sub-period of the second period;
• and
• performing one or more matrix operations to acquire the transcapacitive measurement between the sensor electrode and the bordering sensor electrode.