Method and apparatus for temperature and voltage management control

An apparatus for managing processing unit power comprising:

• a processing unit comprised of a plurality of transistors;
• and
• temperature inversion based power analysis logic operatively coupled to the processing unit and operative to:
• determine that the plurality of transistors are operating in a temperature inversion range based on a supply voltage to the processing unit;
• and
• provide a supply voltage set signal to adjust the supply voltage to the processing unit to cause the plurality of transistors to operate in the temperature inversion range, based on an operating temperature of the processing unit and on at least one of a plurality of temperature inversion supply voltage indications obtained from temperature inversion based voltage, frequency, temperature (VFT) data, wherein each of the at least one of the plurality of temperature inversion supply voltage indications corresponds to a different supply voltage for the processing unit that causes the plurality of transistors to operate in the temperature inversion range and to a different operating temperature of the processing unit.

An apparatus for managing processing unit power comprising:

• a processing unit comprised of a plurality of transistors;
• an operating temperature sensor operably coupled to the processing unit and operative to obtain an operating temperature of the processing unit;
• supply voltage control circuitry operably coupled to the processing unit and operative to adjust the supply voltage to the processing unit;
• a memory storing a temperature inversion based voltage, frequency, temperature (VFT) table comprising at least one temperature inversion supply voltage indication, wherein each of the at least one temperature inversion supply voltage indication corresponds to a different supply voltage for the processing unit that causes the plurality of transistors to operate in a temperature inversion range and to a different operating temperature of the processing unit;
• and
• temperature inversion based power analysis logic operatively coupled to the processing unit, to the supply voltage control circuitry, and to the memory, and operative to:
• determine that the plurality of transistors are operating in the temperature inversion range based on a supply voltage to the processing unit;
• obtain sensed operating temperature data corresponding to an operating temperature of the processing unit from the operating temperature sensor;
• and
• in response to determining that the plurality of transistors are operating in the temperature inversion range, provide a temperature inversion based supply voltage set signal to the supply voltage control circuitry to cause the supply voltage control circuitry to adjust the supply voltage to the processing unit to cause the plurality of transistors to operate in the temperature inversion range, based on the obtained operating temperature of the processing unit and on the at least one temperature inversion supply voltage indication from the temperature inversion based voltage, frequency, temperature (VFT) table.