Concentric semi-circular split profiling for computed tomographic imaging of electronic beams

An apparatus for analyzing an electron beam, comprising:

• circular sensor disk means for receiving the electron beam, said circular sensor disk means having a central axis;
• an inner semi-circular slit in said circular sensor disk means wherein said inner semi-circular slit extends more than 180 degrees of arc with respect to said central axis of said circular sensor disk means but less than 360 degrees of arc with respect to said central axis of said circular sensor disk means;
• an outer semi-circular slit in said circular sensor disk means wherein said outer semi-circular slit extends more than 180 degrees of arc with respect to said central axis of said circular sensor disk means but less than 360 degrees of arc with respect to said central axis of said circular sensor disk means and wherein said outer semi-circular slit is spaced from said first semi-circular slit by a fixed distance;
• a system for sweeping the electron beam radially outward from said central axis to said inner semi-circular slit and outer second semi-circular slit;
• a sensor structure operatively connected to said circular sensor disk means wherein said sensor structure receives the electron beam when it passes over said inner semi-circular slit and said outer semi-circular slit;
• and
• a device for measuring the electron beam that is intercepted by said inner semi-circular slit and said outer semi-circular slit.

A method of analyzing an electron beam, comprising the steps of:

• providing a circular sensor adapted to receive the electron beam, said circular electron beam diagnostic sensor having a central axis;
• providing an inner semi-circular slit in said circular sensor disk wherein said inner semi-circular slit extends more than 180 degrees of arc with respect to said central axis of said circular sensor disk but less than 360 degrees of arc with respect to said central axis of said circular sensor disk;
• providing an outer semi-circular slit in said circular sensor disk wherein said second semi-circular slit extends more than 180 degrees of arc with respect to said central axis of said circular sensor disk but less than 360 degrees of arc with respect to said central axis of said circular sensor disk and wherein said second semi-circular slit is spaced from said first semi-circular slit by a fixed distance;
• sweeping the electron beam radially outward from said central axis to said inner semi-circular slit and said outer semi-circular slit;
• using a sensor structure operatively connected to said circular sensor disk to receive the electron beam when it passes over said inner semi-circular slit and said outer semi-circular slit;
• and
• measuring the electron beam that is intercepted by said inner semi-circular slit and said outer semi-circular slit.