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US 10,649,027 B2Granted
Semiconductor device including test circuit
AssigneeSK hynix Inc.
InventorsSeong Jin Kim, Dae Ho Yun
Life of this patent
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Abstract
A semiconductor device including a test circuit is disclosed. The semiconductor device includes a test pad coupled to a probe of a test device during a wafer test; a normal pad configured to receive a power or a signal during a normal mode; and a test circuit configured to perform a predetermined test operation based on a test signal received through the test pad. The test circuit is disposed below the normal pad.
Claims7
A semiconductor device comprising:
- a test pad configured to be coupled to a probe of a test device during a wafer test;
- a normal pad configured to receive power or a signal during a normal mode;
- and
- a test circuit configured to perform a predetermined test operation based on a test signal received through the test pad,
- wherein all or some of the test circuit is arranged to overlap with the normal pad in a direction perpendicular to a bottom surface of the normal pad.
2 more elements
Dependencies are inferred from the claim text.