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US 10,649,022 B2Granted
Electronics tester
AssigneeAehr Test Systems
InventorsJovan Jovanovic, Kenneth W. Deboe, Steven C. Steps, Scott E. Lindsey
Life of this patent
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Abstract
A tester apparatus is described. Various components contribute to the functionality of the tester apparatus, including an insertion and removal apparatus, thermal posts, independent gimbaling, the inclusion of a photo detector, a combination of thermal control methods, a detect circuitry in a socket lid, through posts with stand-offs, and a voltage retargeting.
Claims13
A testing apparatus comprising:
- a frame;
- a slot assembly on the frame;
- a slot assembly interface on the slot assembly;
- a holding structure to place a cartridge holding a plurality of microelectronic devices;
- a horizontal transportation apparatus operable to move the cartridge horizontally from a first position to a second position into the slot assembly;
- a vertical transportation apparatus operable to move the cartridge and the slot assembly in a first vertical direction relative to one another to engage the slot assembly interface with a cartridge interface on the cartridge;
- and
- a tester connected through the slot assembly interface and the cartridge interface to provide at least power to each microelectronic device and to measure a performance of the microelectronic device, the vertical transportation apparatus being operable to move the cartridge and the slot assembly in a second vertical direction relative to one another, the second vertical direction being opposite to the first vertical direction to disengage the slot assembly interface from the cartridge interface, and the horizontal transportation apparatus being operable to move the cartridge horizontally from the second position to the first position out of the slot assembly.
5 more elements
A method of testing electronic devices comprising:
- holding a cartridge holding a plurality of microelectronic devices in a first position at least partially outside a slot assembly on a frame;
- moving the cartridge horizontally from the first position to a second position into a slot assembly;
- moving the cartridge and the slot assembly in a first vertical direction relative to one another to engage a slot assembly interface on the slot assembly with a cartridge interface on the cartridge;
- testing the microelectronic devices through the slot assembly interface and the cartridge interface by providing at least power to each microelectronic device and measuring a performance of the microelectronic device;
- moving the cartridge and the slot assembly in a second vertical direction relative to one another, the second vertical direction being opposite to the first vertical direction to disengage the slot assembly interface from the cartridge interface;
- and
- moving the cartridge horizontally from the second position to the first position out of the slot assembly.
4 more elements
Dependencies are inferred from the claim text.