Optically probed multi-element electric field sensing system
AssigneeX Development LLC
InventorsMartin Friedrich Schubert, Michael Jason Grundmann
Life of this patent
Estimating the term…
Loading patent…
AssigneeX Development LLC
InventorsMartin Friedrich Schubert, Michael Jason Grundmann
Estimating the term…
A system and a method for determining local electric field strengths, the system including: a light source module configured to emit light; a plurality of electric field sensors, each sensor including a light input portion and a light output portion, each sensor including an electro-optic material arranged in a path of at least some of the received light, an optical property of the electro-optic material being variable depending on a local electric field strength at the sensor, and the electro-optic material being arranged in the sensor such that a property of the output light varies depending on the local electric field strength; a light detection module arranged to receive the output light from the sensors; and a processing module in communication with the light detection module, the processing module being programmed to determine a corresponding value for the electric field strength local to each of the sensors.
A system comprising:
The system of 1, wherein the electro-optic material is selected from the group consisting of:
A system comprising:
A system comprising:
Dependencies are inferred from the claim text.