A probe for non-destructive measurement of complex relative dielectric permittivity of a dielectric material, said probe comprising:
- a mounting harness having a first rectangular section with a thickness with said mounting harness having a first face and a second face along a longitudinal axis of said first rectangular section with a first aperture thru the thickness of said first rectangular section in proximity to a first longitudinal end of said first rectangular section and a second aperture thru the thickness in proximity to a second longitudinal end of said first rectangular section, a second rectangular section having a cutout with a recess for fastener attachment and with said second rectangular section extending from the second face of said first rectangular section on a side of the first aperture opposite to the first longitudinal end, a third rectangular section having a cutout with a recess for fastener attachment to face the cutout of said second rectangular section and with said third rectangular section extending from the second face of said first rectangular section on a side of the second aperture opposite to the second longitudinal end, and a feed point connector positioned at a center of said first rectangular section to have a recess connection on the second face of said first rectangular section and a cylindrical protrusion connection on the first face of said first rectangular section;
- a first side electrode formed as a rectangular section with a longitudinal first face and a longitudinal second face separated by a thickness with said section having a cutout on the longitudinal first face with a recess for fastener attachment, said first side electrode having a first end and a second end formed as a bulbous tip having a surface area wherein said first end is fastened to said second rectangular section and the second face of said first rectangular section of said mounting harness;
- a second side electrode, said second electrode being a same size and shape as said first side electrode and having a cutout with a recess for fastener attachment to face the cutout of said first side electrode, said second side electrode having a first end and a second end formed as a bulbous tip having a surface area wherein said first end is fastened to said second rectangular section and the second face of said first rectangular section of said mounting harness;
- and
- a center electrode with a thickness with said center electrode having a first end and a second end positioned between and spaced apart from said first electrode and said second electrode with said center electrode soldered at the first end to said feed point connector within the recess connection, said center electrode formed as a rectangular section with a first cutout in alignment with the cutouts of said first side electrode and said second side electrode and having a recess for fastener attachment, a second cutout in alignment with the cutouts of said second rectangular section and said third rectangular section and having a recess for fastener attachment with said center electrode having an axis of rotation between the first end and the second end to allow said center electrode to pivot, the second end formed as a bulbous tip with a surface area with a same radius as the bulbous tip of said first side electrode and a same radius as the bulbous tip of said second side electrode;
- wherein a portion of the surface area of said bulbous tip of said center electrode is contactable with the material thereby permitting measurement of the dielectric permittivity of the material such that said probe is capable of accommodating a voltage wave generated by a vector network analyzer that is guided between the electrodes and travels toward the bulbous tip and into the material, the material reflects the incoming voltage wave back to thru the bulbous tip of said center electrode and said feed point connector to the network analyzer with the ratio of the reflected and forward voltages being a reflection coefficient having dielectric properties of the material inferred from data of the reflection coefficient.