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US 10,648,996 B2Granted
Specimen measurement apparatus and specimen aspiration method
AssigneeSysmex Corporation
InventorsToru Mizuhashi, Hiroaki Tobimatsu, Tomoya Hayashi
Life of this patent
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Abstract
A specimen measurement apparatus may include: an aspirator via which a specimen is aspirated. A flow path may be connected to the aspirator. A first pump may be connected to the flow path. A second pump may be connected to the flow path. A controller may select and cause either the first pump or the second pump to aspirate the specimen via the aspirator.
Claims20
A specimen measurement apparatus comprising:
- an aspirator via which a specimen is aspirated;
- a flow path connected to the aspirator;
- a first pump connected to the flow path and configured to generate a first air pressure regulated to aspirate a first amount of the specimen;
- a second pump connected to the flow path and configured to generate a second air pressure regulated to aspirate a second amount, which is different from the first amount, of the specimen;
- and
- a controller configured to selectively cause either the first pump or the second pump to aspirate the specimen via the aspirator.
3 more elements
A specimen aspiration method comprising:
- selecting one of a first measurement mode and a second measurement mode;
- driving, based on the selected one of the first measurement mode and the second measurement mode, a first pump for the first measurement mode or a second pump for the second measurement mode;
- and
- aspirating a specimen via an aspirator connected to a flow path, based on the driving, by the first pump or by the second pump, wherein a first amount of the specimen is aspirated with the first pump and a second amount, which is different from the first amount, of the specimen is aspirated with the second pump.
1 more element
Dependencies are inferred from the claim text.