Measuring and analyzing residual stresses and their gradients in materials using high resolution grazing incidence X-ray diffraction

A non-transitory computer readable medium comprising instructions that, when executed by at least one processor comprising hardware, configure the at least one processor to:

• receive first measurement data comprising intensities of X-ray photons at a plurality of two theta angles, the first measurement data generated by a performance of a grazing incidence X-ray diffraction scan on a material with an incidence angle between an X-ray source and the material set at a first target incidence angle greater than the critical angle of the material;
• analyze the first measurement data to identify a plurality of diffraction peaks from the material, each diffraction peak having an intensity occurring at a corresponding two theta value;
• select a diffraction peak of the plurality of diffraction peaks based on the analysis of the first measurement data;
• receive second measurement data, the second measurement data generated by a performance of two theta scanning on the material on a range of two theta values around the two theta value of the selected diffraction peak at a plurality of tilt positions;
• apply refraction correction to the second measurement data, the refraction correction correcting the second measurement data for each tilt position of the scanned range of two theta values around the two theta value of the selected diffraction peak;
• convert the corrected second measurement data measured at each tilt position to a d-spacing for each tilt position;
• and
• determine residual stress values of the material based on the converted corrected second measurement data.