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US 10,648,914 B2Granted
Optical sample detection system
AssigneeKonica Minolta, Inc.
InventorsFumio Nagai, Tetsuya Noda
Life of this patent
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Abstract
An optical sample detection system includes: a sensor chip including a dielectric member, a metal film adjacent to an upper surface of the dielectric member, a reaction layer adjacent to an upper surface of the metal film, and a lid member disposed on an upper surface of the reaction layer; a chip holding unit for holding the sensor chip; and a light projecting unit that irradiates the metal film with excitation light through the dielectric member. A sample is detected by irradiating the metal film with excitation light through the dielectric member. The lid member is wider than the dielectric member in an optical path cross section of the excitation light.
Claims20
An optical sample detection system comprising:
- a sensor chip including:
- a dielectric member, the dielectric member having an upper surface, a first side surface and a second side surface;
- a metal film adjacent to the upper surface of the dielectric member;
- a reaction layer adjacent to an upper surface of the metal film;
- and
- a lid member disposed on an upper surface of the reaction layer;
- a chip loader including a chip holder for holding the sensor chip;
- and
- a light projecting unit that irradiates the metal film with excitation light through the dielectric member, the light projecting unit being disposed on a first side surface side of the sensor chip, the light projecting unit being configured to emit the excitation light toward the first side surface as an incidence surface of the dielectric member, the optical sample detection system detecting a sample by irradiating the metal film with the excitation light through the dielectric member, wherein
- the lid member has a larger width than the width of the dielectric member in an optical path cross section of the excitation light,
- the dielectric member is dimensioned such that the excitation light incident on the incidence surface of the dielectric member is incident on the metal film for detection, and then reflected from the metal surface toward the second side surface as an emission surface of the dielectric member, the emission surface being configured and dimensioned to:
- (a) emit excitation light reflected from the metal surface to outside the dielectric member, and (b) reflect emission surface reflected light, such that the emission surface reflected light travels towards the incidence surface, the dielectric member being dimensioned such that the emission surface reflected light is emitted, at the incidence surface, to an outside of the dielectric member at an angle so that the light emitted at the incidence surface is not incident on the lid member within a measurement scanning angle of the excitation light.
9 more elements
An optical sample detection system comprising:
- a sensor chip including:
- a dielectric member;
- a metal film adjacent to an upper surface of the dielectric member;
- a reaction layer adjacent to an upper surface of the metal film;
- and
- a lid member disposed on an upper surface of the reaction layer;
- a chip loader including a chip holder for holding the sensor chip;
- and
- a light projecting unit that irradiates the metal film with excitation light through the dielectric member, the optical sample detection system detecting a sample by irradiating the metal film with the excitation light through the dielectric member, wherein
- the lid member has a larger width than the width of the dielectric member in an optical path cross section of the excitation light, and
- emission surface reflected light emitted to an outside of the dielectric member after the excitation light is reflected by an emission surface of the dielectric member is not incident on the lid member within a measurement scanning angle of the excitation light,
- wherein a bottom surface of the dielectric member is a scattering surface.
9 more elements
An optical sample detection system comprising:
- a sensor chip including:
- a dielectric member;
- a metal film adjacent to an upper surface of the dielectric member;
- a reaction layer adjacent to an upper surface of the metal film;
- and
- a lid member disposed on an upper surface of the reaction layer;
- a chip loader including a chip holder for holding the sensor chip;
- and
- a light projecting unit that irradiates the metal film with excitation light through the dielectric member, the optical sample detection system detecting a sample by irradiating the metal film with the excitation light through the dielectric member, wherein
- the lid member has a larger width than the width of the dielectric member in an optical path cross section of the excitation light, and
- emission surface reflected light emitted to an outside of the dielectric member after the excitation light is reflected by an emission surface of the dielectric member is not incident on the lid member within a measurement scanning angle of the excitation light,
- wherein a bottom surface of the dielectric member is a non-flat surface.
9 more elements
Dependencies are inferred from the claim text.