Method and system for measuring photothermal deflection

A photothermal deflection measuring method for determining emitting heat comprising steps of:

• providing a substrate having a plurality of positioning structures, each of which is utilized to support an object, a detecting light source, a detecting unit, and a processor in electrical communication with the detecting unit;
• stimulating the object to generate and emit heat wherein the emitted heat forms a thermal field for changing a gradient of a refractive index of a medium around the object;
• enabling the detecting light source to generate a detecting light and to project the detecting light onto a specific position of the thermal field wherein the detecting light is refracted to have a deflection in response to the corresponding refractive index of the specific position while passing through the specific position of the thermal field;
• enabling the detecting unit to receive the detecting light passing through the specific position and to generate an optical deflection signal with respect to a deflection value of the received detecting light;
• and
• determining a heat value corresponding to the specific position according to the optical deflection signal by the processor.