System and process for roof measurement using imagery
AssigneePictometry International Corp.
InventorsDale R. Thornberry, Chris T. Thornberry, Mark F. Garringer
Life of this patent
Estimating the term…
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AssigneePictometry International Corp.
InventorsDale R. Thornberry, Chris T. Thornberry, Mark F. Garringer
Estimating the term…
The present disclosure describes systems and processes, including processes in which first location data is received. Visual access to a first image corresponding to the first location data is provided, the first image including a roof structure of a building. A first computer input capable of signaling a designation from the user of a building roof structure location within the first image is provided. A designation of the building roof structure location within the first image is received. Responsive to receiving the designation of the building roof structure location, a second computer input capable of signaling user-acceptance of the building roof structure location within the first image is provided. Subsequent to receiving the user-acceptance confirming the designation of the building roof structure location, a report of the roof structure is provided.
A process, comprising:
A non-transitory computer memory storing computer logic, that when executed by computer hardware causes the computer hardware to:
A method, comprising:
Dependencies are inferred from the claim text.