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US 10,648,797 B2Granted
Multiple beam scanning system for measuring machine
AssigneeQuality Vision International, Inc.
InventorDaniel James Lawler Williams
Life of this patent
Estimating the term…
Abstract
An optical measuring system for a measuring machine includes at least two scanning devices for intermittently moving through alternately timed sequences of static measuring positions at which a measuring beam is directed to and from a test object. An optical switch selectively routes the measuring beam through any one of the scanning devices that has settled into one of the static measuring positions.
Claims28
An optical measuring system for measuring machines comprising:
- a beam source for producing a measuring beam;
- at least two scanning devices separately movable through differently timed sequences of static measuring positions by which the measuring beam is steered to different positions on a test object;
- a common detector for detecting changes in the measuring beam returning from the test object through the at least two scanning devices;
- a computer coupled to the at least two scanning devices the computer being arranged for controlling the movement of the at least two scanning devices through the differently timed sequences of static measuring positions;
- and
- an optical switch for selectively routing the measuring beam through any one of the at least two scanning devices that has settled into one of the static measuring positions.
3 more elements
A method of measuring a test object with an optical measuring system comprising the steps of:
- producing a measuring beam;
- intermittently moving a first scanning device through a first sequence of static measuring positions at which the measuring beam is directed to and from a first series of positions on a test object;
- intermittently moving a second scanning device through a second sequence of static measuring positions at which the measuring beam is directed to and from a second series of positions on the test object;
- recording measurement data from the measuring beam returning from the test object through the first and second scanning devices to a detector;
- timing motions of the first and second scanning devices so that (a) the second scanning device is moving while the first scanning device has settled into measuring positions of the first sequence of static measuring positions and (b) the first scanning device is moving while the second scanning device has settled into measuring positions of the second sequence of static measuring positions;
- directing the measuring beam through the first scanning device to the test object and from the test object through the first scanning device to the detector while the first scanning device has settled into the measuring positions of the first sequence of static measuring positions;
- and
- directing the measuring beam through the second scanning device to the test object and from the test object through the second scanning device to the detector while the second scanning device has settled into the measuring positions of the second sequence of static measuring positions.
5 more elements
Dependencies are inferred from the claim text.