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US 10,648,791 B2Granted
Conformance test artifact for coordinate measuring machine
AssigneeHexagon Metrology, Inc.
InventorCharles Salvatore Lamendola
Life of this patent
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Abstract
A test artifact for a coordinate measuring machine includes a calibrated standard and a convex background illumination surface. The calibrated standard, the convex background illumination surface and a vision sensor are positionable relative to one another so as to create a silhouette of the calibrated sphere in the vision sensor's field of view. The test artifact may thus be used to calibrate the coordinate measuring machine, and/or to assess the associativity between the vision sensor and another measuring sensor.
Claims10
A test artifact for calibrating a vision CMM, the test artifact comprising:
- a base configured to rest on a table of the CMM;
- a calibrated standard suspended from the base;
- and
- a convex background illumination surface suspended relative to the base to be positionable such that the calibrated standard is between the background illumination surface and a vision sensor, wherein the convex background illumination surface is reflective, and creates the silhouette by reflecting light towards the vision sensor.
1 more element
Dependencies are inferred from the claim text.