iFR-CT
AssigneeKoninklijke Philips N.V.
InventorsLiran Goshen, Yechiel Lamash
Life of this patent
Estimating the term…
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AssigneeKoninklijke Philips N.V.
InventorsLiran Goshen, Yechiel Lamash
Estimating the term…
A method includes for non-invasively determining an instantaneous wave-free ratio metric includes receiving electronically formatted image data generated by an imaging system. The image data includes voxels with intensities representative of a vessel with a stenosis. The method further includes computing peripheral resistances of outlets of the vessel from the image data. The method further includes calculating a stenosis resistance of the stenosis between an inlet of the vessel inlet and the outlets of the vessel based on a set of boundary conditions and a computational fluid dynamics algorithm. The method further includes calculating the instantaneous wave-free ratio metric. The metric is a numerical value, based on the stenosis resistance and generating a signal indicative of the calculated instantaneous wave-free ratio metric.
A method for non-invasively determining an instantaneous wave-free ratio metric by a data analyzer, comprising:
A system for non-invasively determining an instantaneous wave-free ratio metric, comprising:
A non-transitory computer readable storage medium having one or more executable instructions stored thereon, which, when executed by at least one processor, cause the at least one processor to perform a method for non-invasively determining an instantaneous wave-free ratio metric by a data analyzer, the method comprising:
Dependencies are inferred from the claim text.