Microscope
AssigneeFlowVIEW Tek
InventorsHsin-Hung Lee, Cheng-Yu Lee
Life of this patent
Estimating the term…
Abstract
A microscope adapted to observe a sample is provided. The microscope includes a carrier, and the carrier includes a bottom base, an upper cover and a protruding structure. The upper cover is disposed on the bottom base and has an observing region, and the sample is adapted to be observed in the observing region. A first flow passage is formed between the bottom base and the upper cover, the observing region is located in the first flow passage, and a first fluid is adapted to flow through the observing region along the first flow passage. The protruding structure is connected to the bottom base or the upper cover and located in the first flow passage, and the protruding structure surrounds the observing region.
Claims20
A microscope, adapted to observe a sample, the microscope comprising at least one carrier, the at least one carrier comprising:
- a bottom base;
- an upper cover, disposed on the bottom base and having an observing region, wherein the sample is adapted to be observed in the observing region, and a first flow passage is formed between the bottom base and the upper cover, the observing region is located in the first flow passage, a first fluid adapted to pass through the observing region along the first flow passage;
- and
- a protruding structure, connected to the bottom base or the upper cover and located in the first flow passage, wherein the protruding structure surrounds the observing region.
Dependencies are inferred from the claim text.