Phase retardance optical scanner
AssigneeLumina Instruments Inc.
InventorsSteven W. Meeks, Hung Phi Nguyen, Alireza Shahdoost Moghaddam
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AssigneeLumina Instruments Inc.
InventorsSteven W. Meeks, Hung Phi Nguyen, Alireza Shahdoost Moghaddam
Estimating the term…
An optical scanning system includes a radiating source capable of outputting a light beam, a first time varying beam reflector that is configured to reflect the light beam through a scan lens towards a transparent sample at an incident angle that is not more than one degree greater or less than Brewster's angle of the transparent sample, and a second time varying beam reflector that is configured to reflect the light beam reflected from the transparent sample after passing through a de-scan lens onto a phase retardance detector. The output of the phase retardance detector is usable to determine if a defect is present on the transparent sample. The first time varying beam reflector causes a first phase retardance of the light beam and the second time varying beam reflector causes a second phase retardance of the reflected light beam in the opposite direction of the first phase retardance.
An optical scanning system, comprising:
An optical scanning system, comprising:
Dependencies are inferred from the claim text.