A mass analyzing system for time-of-flight (“TOF”) mass spectrometry analysis, the system coupleable to a pulsed ion source providing a first, pulsed ion beam having an input TOF focus, the system comprising:
- an electrostatic mirror prism arrangement comprising:
- a first electrostatic mirror prism having a first plurality of planar electrodes to generate a first retarding electric field to reflect the first ion beam and provide a second, intermediate ion beam having a spatial dispersion of ions proportional to ion kinetic energies, the second ion beam having an intermediate TOF focus;
- and
- a second electrostatic mirror prism spaced apart from the first electrostatic mirror prism by a first predetermined distance and further arranged to have a predetermined first angular offset from the first electrostatic mirror prism, the second electrostatic mirror prism having a second plurality of planar electrodes to generate a second retarding electric field to reflect the second ion beam and converge the spatial dispersion of ions to provide a third, recombined ion beam, the third ion beam having an output TOF focus;
- and
- an ion detector arranged at the output TOF focus to receive the third ion beam, the ion detector adapted to detect a plurality of ions of the third ion beam.