Method of manufacturing parts having a dimensional requirement akin to a tolerance stack-up

Method of manufacturing parts produced with a manufacturing device, where each part must satisfy an overall dimensional requirement on a specific dimension of said part, said overall dimensional requirement being akin to a tolerance stack up comprising at least two dimensions, each dimension corresponding to a characteristic dimension of the part, in which:

• the overall dimensional requirement is fixed so that the specific dimension of the parts has an average μG and a standard deviation σG in an overall area of acceptance constructed from one or more statistical criteria;
• a reference dimension is selected from among the characteristic dimensions comprising the tolerance stack-up, and an average μref and a standard deviation σref of said reference dimension are calculated from a sample of parts taken from among the parts produced with the manufacturing device;
• an area of acceptance for the other characteristic dimensions of the tolerance stack-up is calculated from the overall area of acceptance, from the average μref and the standard deviation σref calculated for the reference dimension, from limit values of an average μGL and a standard deviation σGL forming the overall area of acceptance for the specific dimension, and by taking μi=μGL−μref and σi=√{square root over (σ2GL−σ2ref)}, where μi and σi are respectively an average and a standard deviation of the corresponding characteristic dimension the area of acceptance being constructed from the same one or more statistical criteria of the overall area of acceptance;
• and
• the manufacturing of parts without verification of the reference dimension is controlled by using the area of acceptance calculated for the other characteristic dimensions of the tolerance stack-up by adjusting regulating parameters of the manufacturing device so that each of the other characteristic dimensions of the tolerance stack-up is included in the corresponding calculated area of acceptance.