Method, apparatus and system for inspecting object based on cosmic ray

An apparatus for inspecting an object based on a cosmic ray, comprising:

• a processor;
• a memory for storing instructions executable by the processor;
• wherein the processor is configured to:
• record a movement trajectory of an inspected object by using a monitoring device;
• acquire information of charged particles in the cosmic ray by using a position-sensitive detector, the information of charged particles comprising trajectory information of the charged particles, wherein the information of the charged particles is updated in real time;
• perform position coincidence for the movement trajectory and the trajectory information to determine the object;
• perform trajectory remodeling for the charged particles according to the information of charged particles, wherein in performing the trajectory remodeling for the charged particles according to the information of charged particles, the processor is configured to:
• calculate a Ratio parameter of a material according to the trajectory information of the charged particles and estimate an initial atomic number and an initial relative mass number of the material, the Ratio parameter being a ratio between a scattering parameter and a stopping parameter that are exerted by the material on the charged particles;
• calculate a radiation length according to a relationship between the initial atomic number and the radiation length and a relationship between the initial relative mass number and the radiation length;
• acquire a thickness of the material according to the radiation length;
• and
• calculate the stopping parameter and the scattering parameter of the material according to the initial atomic number, the initial relative mass number and the thickness of the material, and identify the material according to the stopping parameter and the scattering parameter, wherein low atomic number materials are identified by using a stopping effect of electrons in the charged particles, and medium to high atomic number materials are identified by using a scattering effect of muons in the charged particles;
• and
• identify a material inside the moving object according to the trajectory remodeling,
• wherein the monitoring device comprises a plurality of depth camera covering a passageway for detecting and tracking the movement trajectory of the inspected object, and the movement trajectory is obtained from the plurality of depth cameras.

A system for inspecting an object based on a cosmic ray, comprising:

• a monitoring device, configured to record a movement trajectory of an inspected object;
• a position-sensitive detector, configured to detect information of charged particles in the cosmic ray, the information of charged particles comprising trajectory information of the charged particles, wherein the information of the charged particles is updated in real time;
• and
• a console, configured to perform position coincidence for the movement trajectory and the trajectory information to determine the moving object, perform trajectory remodeling for the charged particles according to the information of charged particles, and identify a material inside the moving object according to the trajectory remodeling,
• wherein in performing the trajectory remodeling for the charged particles according to the information of charged particles, the console is configured to:
• calculate a Ratio parameter of a material according to the trajectory information of the charged particles and estimate an initial atomic number and an initial relative mass number of the material, the Ratio parameter being a ratio between a scattering parameter and a stopping parameter that are exerted by the material on the charged particles;
• calculate a radiation length according to a relationship between the initial atomic number and the radiation length and a relationship between the initial relative mass number and the radiation length;
• acquire a thickness of the material according to the radiation length;
• and
• calculate the stopping parameter and the scattering parameter of the material according to the initial atomic number, the initial relative mass number and the thickness of the material, and identify the material according to the stopping parameter and the scattering parameter, wherein low atomic number materials are identified by using a stopping effect of electrons in the charged particles, and medium to high atomic number materials are identified by using a scattering effect of muons in the charged particles,
• wherein the monitoring device comprises a plurality of depth camera covering a passageway for detecting and tracking the movement trajectory of the inspected object, and the movement trajectory is obtained from the plurality of depth cameras.