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US 10,605,701 B2Granted
Analysis system
AssigneeJtekt Corporation
InventorsToshiyuki Tsuzuki, Sakon Murayama, Yuki Ishigure
Life of this patent
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Abstract
An analysis system includes detectors provided in an apparatus, first analysis devices each configured to generate processed data by performing predetermined processing on detection information from each of the detectors, and to evaluate an object to be evaluated based on the detection information from each of the detectors and on an evaluation pattern, and a second analysis device configured to update the evaluation pattern based on the processed data generated by each of the first analysis devices.
Claims20
An analysis system, comprising:
- a detector provided in an apparatus;
- a first analysis device configured to:
- generate processed data by performing predetermined processing on detection information from the detector, and
- evaluate an object to be evaluated based on the detection information from the detector and on an evaluation pattern;
- and
- a second analysis device different from the first analysis device and configured to update the evaluation pattern based on the processed data generated by the first analysis device.
3 more elements
An analysis system, comprising:
- a detector provided in an apparatus and configured to output detection information;
- a first analysis device configured to:
- receive the detection information from the detector,
- collect a subset of the detection information, the subset of the detection information being a set of the detection information whose quantity is less than the detection information, and
- evaluate an object to be evaluated based on the subset of the detection information;
- and
- a second analysis device different from the first analysis device and configured to:
- receive the subset of the detection information from the first analysis device,
- update the evaluation pattern based on the subset of the detection information, and
- send the updated evaluation pattern to the first analysis device,
- wherein the first analysis device evaluates the object to be evaluated based on the updated evaluation pattern.
8 more elements
Dependencies are inferred from the claim text.