Substrate package having variable marking
AssigneePalo Alto Research Center Incorporated
InventorsJanos Veres, Antonio St. Clair Lloyd Williams, Marc E. Mosko
Life of this patent
Estimating the term…
Abstract
Disclosed are a substrate package, a method of fabricating the substrate package, and a system including the substrate package. The substrate package includes a stack of substrate sheets in an individual form, a continuous form, or a roll form. The stack has a sidewall defined by edges of the substrate sheets and a mark on the sidewall includes mark segments on respective edges. The mark segments vary such that one or more of the mark segments have a respective segment characteristic, such as a length. The segment characteristic can encode information about an attribute of the substrate sheet, such as a physical characteristic of the sheet.
Claims19
A substrate package, comprising:
- one or more substrate sheets arranged in a stack, wherein the stack has a sidewall defined by edges of the one or more substrate sheets;
- and
- a mark on the sidewall, wherein the mark includes a plurality of mark segments on the edges and along a mark axis, wherein the mark varies along the mark axis, and wherein segment characteristics of the plurality of mark segments vary along the mark axis such that a mark segment on an edge of a substrate sheet has a segment characteristic specific to an attribute of the substrate sheet, wherein the one or more substrate sheets have respective faces, and wherein the plurality of mark segments extend from the edges onto the faces.
A substrate package, comprising:
- one or more substrate sheets arranged in a stack, wherein the stack has a sidewall defined by edges of the one or more substrate sheets;
- and
- a mark on the sidewall, wherein the mark includes a plurality of mark segments on the edges and along a mark axis, wherein the mark varies along the mark axis, and wherein segment characteristics of the plurality of mark segments vary along the mark axis such that a mark segment on an edge of a substrate sheet has a segment characteristic specific to an attribute of the substrate sheet, wherein the plurality of mark segments include an indentation in the edges.
A method, comprising:
- arranging one or more substrate sheets into a stack having edges of the one or more substrate sheets forming a sidewall defined by the edges;
- applying a mark on the sidewall, wherein the mark includes a plurality of mark segments on the edges and along a mark axis, wherein the mark varies along the mark axis, and wherein segment characteristics of the plurality of mark segments vary along the mark axis such that a mark segment on an edge of a substrate sheet has a segment characteristic specific to an attribute of the substrate sheet;
- deforming the stack to expose faces of the one or more substrate sheets;
- and
- applying the mark on the exposed faces.
Dependencies are inferred from the claim text.