Semiconductor device and method for manufacturing the same
AssigneeHitachi, Ltd.
InventorNaoki Watanabe
Life of this patent
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Abstract
A semiconductor device includes a semiconductor substrate having a main surface and a back surface, a drift region having a first conductivity type, a body region formed in the drift region and having a second conductivity type, a plurality of grooves passing through the body region from the main surface toward the back surface, a gate electrode formed in the plurality of grooves with a gate insulating film interposed therebetween, and an electric field relaxation layer provided below the plurality of grooves in the drift region and having a second conductivity type. The electric field relaxation layer continuously extends over the entire body region.
Claims9
A semiconductor device comprising:
- a semiconductor substrate having a main surface and a back surface;
- a drift region provided in the semiconductor substrate so as to be in contact with the main surface, the drift region having a first conductivity type;
- a body region selectively provided in the drift region, the body region having a second conductivity type different from the first conductivity type;
- first and second grooves passing through the body region, the first and second grooves extending in a first direction in plan view and disposed in a spaced relationship from each other in a second direction perpendicular to the first direction;
- a first semiconductor region formed in the body region, the first semiconductor region disposed between the first groove and the second groove and having the second conductivity type;
- a second semiconductor region formed in the body region, the second semiconductor region disposed between the first groove and the first semiconductor region and having the first conductivity type;
- a third semiconductor region formed in the body region, the third semiconductor region disposed between the second groove and the first semiconductor region and having the first conductivity type;
- a fourth semiconductor region formed in the drift region, the fourth semiconductor region disposed below the first and second grooves and having the second conductivity type;
- a first gate electrode formed in the first groove with a first gate insulating film interposed therebetween;
- a second gate electrode formed in the second groove with a second gate insulating film interposed therebetween;
- a first electrode formed on the main surface of the semiconductor substrate, the first electrode electrically connected to the first semiconductor region, the second semiconductor region, and the third semiconductor region;
- and
- a second electrode formed on the back surface of the semiconductor substrate, wherein
- the fourth semiconductor region continuously extends below the first groove and below the second groove in the first direction, and
- the fourth semiconductor region continuously extends below the first groove, the second semiconductor region, the first semiconductor region, the third semiconductor region, and the second groove in the second direction.
Dependencies are inferred from the claim text.