Semiconductor device
AssigneeSocionext Inc.
InventorsMasaki Tamaru, Kazuyuki Nakanishi, Hidetoshi Nishimura
Life of this patent
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Abstract
A well potential supply region is provided in an N-type well region of a cell array. Adjacent gates disposed in both sides of the well potential supply region in the horizontal direction and adjacent gates disposed in further both sides thereof are disposed at the same pitch. In addition, an adjacent cell array includes four gates each of which is opposed to the adjacent gates in the vertical direction. In other words, regularity in the shape of the gate patterns in the periphery of the well potential supply region is maintained.
Claims26
A semiconductor device comprising:
- a plurality of cell arrays arranged sequentially in a first direction, each of the plurality of cell arrays including a plurality of gates extending in the first direction and arranged in a second direction orthogonal to the first direction,
- wherein each of the plurality of cell arrays includes a first conductive type well region and a second conductive type region extending in the second direction and formed below the plurality of gates,
- wherein a first cell array of the plurality of cell arrays includes:
- a first well potential supply region in the first conductive type well region, the first well potential supply region including impurities of the same conductive type as the first conductive type well region;
- a second potential supply region in the second conductive type region, the second potential supply region including impurities of the same conductive type as the second conductive type region;
- a first impurity region in the second conductive type region, the first impurity region including impurities of the same conductive type as the first conductive type well region;
- and
- first, second and third adjacent gates of the plurality of gates, the first, second and third adjacent gates being disposed at the same pitch in the second direction,
- wherein a portion of the first well potential supply region is disposed between the first adjacent gate and the second adjacent gate, and the third adjacent gate is disposed adjacent to the first adjacent gate, and a portion of the first impurity region is disposed between the first adjacent gate and the second adjacent gate, the portion of the first impurity region being adjacent to and opposed to the portion of the first well potential supply region in the first direction,
- wherein a second cell array of the plurality of cell arrays adjacent to the first cell array in the first direction includes fourth, fifth and sixth adjacent gates, the fourth, fifth and sixth adjacent gates being opposed to the first, second and third adjacent gates of the first cell array in the first direction, respectively, and
- wherein the first adjacent gate overlaps a portion of the first well potential supply region.
A semiconductor device comprising:
- a plurality of cell arrays arranged sequentially in a first direction, each of the plurality of cell arrays including a plurality of gates extending in the first direction and arranged in a second direction orthogonal to the first direction,
- wherein each of the plurality of cell arrays includes a first conductive type well region and a second conductive type region extending in the second direction and formed below the plurality of gates,
- wherein a first cell array of the plurality of cell arrays includes:
- a first well potential supply region in the first conductive type well region, the first well potential supply region including impurities of the same conductive type as the first conductive type well region;
- a second potential supply region in the second conductive type region, the second potential supply region including impurities of the same conductive type as the second conductive type region;
- a first impurity region in the second conductive type region, the first impurity region including impurities of the same conductive type as the first conductive type well region;
- and
- first, second and third adjacent gates of the plurality of gates, the first, second and third adjacent gates being disposed at the same pitch in the second direction,
- wherein a portion of the first well potential supply region is disposed between the first adjacent gate and the second adjacent gate, and the third adjacent gate is disposed adjacent to the first adjacent gate, and a portion of the first impurity region is disposed between the first adjacent gate and the second adjacent gate, the portion of the first impurity region being adjacent to and opposed to the portion of the first well potential supply region in the first direction,
- wherein a second cell array of the plurality of cell arrays adjacent to the first cell array in the first direction includes:
- a third well potential supply region in the first conductive type well region, the third well potential supply region including impurities of the same conductive type as the first conductive type well region;
- a fourth potential supply region in the second conductive type region, the fourth potential supply region including impurities of the same conductive type as the second conductive type region;
- and
- fourth, fifth and sixth adjacent gates, the fourth, fifth and sixth adjacent gates being opposed to the first, second and third adjacent gates of the first cell array in the first direction, respectively, and
- wherein the first adjacent gate overlaps a portion of the first well potential supply region.
A semiconductor device comprising:
- a plurality of cell arrays arranged sequentially in a first direction, each of the plurality of cell arrays including a plurality of gates extending in the first direction and arranged in a second direction orthogonal to the first direction,
- wherein each of the plurality of cell arrays includes a first conductive type well region and a second conductive type region extending in the second direction and formed below the plurality of gates,
- wherein a first cell array of the plurality of cell arrays includes:
- a first well potential supply region in the first conductive type well region, the first well potential supply region including impurities of the same conductive type as the first conductive type well region;
- a second potential supply region in the second conductive type region, the second potential supply region including impurities of the same conductive type as the second conductive type region;
- a first impurity region in the second conductive type region, the first impurity region including impurities of the same conductive type as the first conductive type well region;
- and
- first, second and third adjacent gates of the plurality of gates, the first, second and third adjacent gates being disposed at the same pitch in the second direction,
- wherein a portion of the first well potential supply region is disposed between the first adjacent gate and the second adjacent gate, and the third adjacent gate is disposed adjacent to the first adjacent gate, and a portion of the first impurity region is disposed between the first adjacent gate and the second adjacent gate, the portion of the first impurity region being adjacent to and opposed to the portion of the first well potential supply region in the first direction,
- wherein a second cell array of the plurality of cell arrays adjacent to the first cell array in the first direction includes fourth, fifth and sixth adjacent gates, the fourth, fifth and sixth adjacent gates being opposed to the first, second and third adjacent gates of the first cell array in the first direction, respectively, and
- wherein at least one of the fifth and sixth adjacent gates are dummy gates.
A semiconductor device comprising:
- a plurality of cell arrays arranged sequentially in a first direction, each of the plurality of cell arrays including a plurality of gates extending in the first direction and arranged in a second direction orthogonal to the first direction,
- wherein each of the plurality of cell arrays includes a first conductive type well region and a second conductive type region extending in the second direction and formed below the plurality of gates,
- wherein a first cell array of the plurality of cell arrays includes:
- a first well potential supply region in the first conductive type well region, the first well potential supply region including impurities of the same conductive type as the first conductive type well region;
- a second potential supply region in the second conductive type region, the second potential supply region including impurities of the same conductive type as the second conductive type region;
- a first impurity region in the second conductive type region, the first impurity region including impurities of the same conductive type as the first conductive type well region;
- and
- first, second and third adjacent gates of the plurality of gates, the first, second and third adjacent gates being disposed at the same pitch in the second direction,
- wherein a portion of the first well potential supply region is disposed between the first adjacent gate and the second adjacent gate, and the third adjacent gate is disposed adjacent to the first adjacent gate, and a portion of the first impurity region is disposed between the first adjacent gate and the second adjacent gate, the portion of the first impurity region being adjacent to and opposed to the portion of the first well potential supply region in the first direction,
- wherein a second cell array of the plurality of cell arrays adjacent to the first cell array in the first direction includes:
- a third well potential supply region in the first conductive type well region, the third well potential supply region including impurities of the same conductive type as the first conductive type well region;
- a fourth potential supply region in the second conductive type region, the fourth potential supply region including impurities of the same conductive type as the second conductive type region;
- and
- fourth, fifth and sixth adjacent gates, the fourth, fifth and sixth adjacent gates being opposed to the first, second and third adjacent gates of the first cell array in the first direction, respectively, and
- wherein at least one of the fifth and sixth adjacent gates are dummy gates.
Dependencies are inferred from the claim text.