Imaging mass spectrometer

A method of time-of-flight mass spectrometry comprising:

• receiving ions at a deflector at different times and deflecting the ions received at the different times to different respective positions in a first array of positions at said different times, wherein the ion deflector deflects the ions so that the ions exit the ion deflector along different axes in an array of parallel axes at different times;
• using ion optics to guide ions from the first array of positions to a position sensitive detector that comprises an array of separate detection regions arranged at different positions on the position sensitive detector, so as to map ions from the first array of positions to a second array of positions on the position sensitive detector,
• wherein the ion optics includes at least one ion mirror that reflects the ions;
• and
• determining that ions received at different ones of said detection regions have originated from different positions in the first array of positions.

A method of time-of-flight mass spectrometry comprising:

• pulsing a first pulse of ions out of a first side of an ion accelerator or ion source and into a first ion mirror at a first time and such that the ions of the first pulse arrive at a first position on a position sensitive detector system that comprises an array of separate detection regions at different positions on the position sensitive detector;
• and
• pulsing a second pulse of ions out of a second, opposite, side of the ion accelerator or ion source and into a second, different ion mirror at a second time and such that the ions of the second pulse arrive at a second, different position on the position sensitive detector system;
• and
• determining that ions received at different positions on the position sensitive detector system have originated from different pulses of ions.

A time-of-flight mass spectrometer comprising:

• first and second ion mirrors;
• an ion accelerator or ion source;
• a position sensitive ion detector comprising an array of separate detection regions at different positions on the position sensitive detector;
• and
• a controller configured to control the spectrometer to:
• pulse a first pulse of ions out of a first side of the ion accelerator or ion source and into the first ion mirror at a first time such that the ions in the first pulse arrive at a first position on the position sensitive detector;
• and
• pulse a second pulse of ions into out of a second, opposite, side of the ion accelerator or ion source and into the second ion mirror at a second time such that the ions in the second pulse arrive at a second, different position on the position sensitive detector;
• wherein the spectrometer is configured to determine that ions received at different positions on the position sensitive detector have originated from different pulses of ions.