Method and apparatus for logically removing defective pages in non-volatile memory storage device
AssigneeCNEX Labs, Inc.
InventorYiren Ronnie Huang
Life of this patent
Estimating the term…
Loading patent…
AssigneeCNEX Labs, Inc.
InventorYiren Ronnie Huang
Estimating the term…
One embodiment of the present invention capable of decommissioning a defective non-volatile memory (“NVM”) page in a block is disclosed. A process able to logically decommission a defective page is able to detect defective or bad pages while executing a write operation writing information to one or more NVM page in a NVM block. For example, after examining operation status after completion of the write operation, the NVM page is identified as a defective page if the operation status fails to meet a set of predefined conditions under a normal write operation. Upon marking a location of a page status table to indicate the NVM page as defective page, the page status table containing the page defective information associated with the NVM page is stored at a predefined page in the NVM block.
A method processed by a memory controller coupled to a non-volatile storage for logically decommissioning a non-volatile memory (“NVM”) page, wherein the NV storage contains a plurality of blocks and each block is divided into multiple NVM pages wherein each NVM page contains at least four (4) kilobyte of storage capacity, the method comprising:
A method processed by a memory controller coupled to a non-volatile storage for logically decommissioning a non-volatile memory (“NVM”) page, wherein the NV storage contains a plurality of blocks and each block is divided into multiple NVM pages wherein each NVM page contains at least four (4) kilobyte of storage capacity, the method comprising:
A solid-state device (“SSD”) containing a plurality of non-volatile memory (“NVM”), comprising:
Dependencies are inferred from the claim text.