Data driver, organic light emitting display device and method for driving thereof
AssigneeLG Display Co., Ltd.
InventorsMoo Kyoung Hong, Kyungsu Lee, Sang Goo Kwon
Life of this patent
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Abstract
The present disclosure relates to a method for detecting a defect of a sensing transistor disposed in each sub pixel of an organic light emitting display device and extracting a coordinate of a sub pixel in which a defective sensing transistor is disposed. A defect detecting data voltage is applied to a data line after initializing a reference voltage line and a voltage of the reference voltage line is sensed during an interval in which the scan transistor is turned on and the sensing transistor is turned off to determine whether the sensing transistor is defective.
Claims18
An organic light emitting display device, comprising:
- an organic light emitting diode;
- a driving transistor that is electrically connected between the organic light emitting diode and a driving voltage line;
- a scan transistor that is electrically connected between a first node of the driving transistor to which a data voltage is applied and a data line;
- a sensing transistor that is electrically connected between a second node at which the driving transistor and the organic light emitting diode are connected and a reference voltage line;
- a sensing unit that is selectably electrically connectable to the reference voltage line, the sensing unit sensing a voltage of the reference voltage line during an interval in which a defect detecting data voltage is applied to the data line, the scan transistor is at an on state, and the sensing transistor is at an off state;
- and
- a defect detecting unit that compares the voltage of the reference voltage line sensed by the sensing unit with a threshold voltage and determines that the sensing transistor is defective if the voltage of the reference voltage line is higher than the threshold voltage.
A device;
- comprising:
- a sensing unit configured to sense a voltage of a reference voltage line associated to a pixel during an interval when a defect detecting data voltage is applied to a data line of the pixel, a scan transistor connected between a first node of a driving transistor of the pixel and the data line is at an on state and a sensing transistor connected between a second node of the driving transistor and the reference voltage line is at an off state;
- a defect detecting unit configured to compare the voltage sensed by the sensing unit with a threshold voltage and to determine whether the sensing transistor is defective based on a result of the comparing;
- and
- a memory configured to store a coordinate of a pixel in which a sensing transistor determined to be defective by the defect detecting unit is disposed.
A method, comprising:
- turning on a reference voltage control switch connected to a reference voltage line to initialize the reference voltage line;
- turning off a sensing transistor connected to the reference voltage line;
- applying a defect detecting data voltage to a data line;
- turning on a scan transistor;
- sensing a voltage of the reference voltage line;
- and
- determining that the sensing transistor is defective when the sensed voltage higher than a threshold voltage.
Dependencies are inferred from the claim text.