Projection pattern creation apparatus and three-dimensional measuring apparatus

A projection pattern creation apparatus configured to create a projection pattern used by a three-dimensional measuring apparatus comprising a pattern projection device and one or more imaging devices and configured to capture an image of a projection pattern projected to an object from the pattern projection device by the one or more imaging devices and measure a three-dimensional position and/or a shape of the object, the projection pattern creation apparatus comprising:

• a projection pattern deformation unit configured to reproduce deformation when the projection pattern projected from the pattern projection device toward an evaluation surface provided in a projection range of the pattern projection device is included in an image captured by the one or more imaging devices, on the basis of characteristics of an optical system of the pattern projection device, characteristics of an optical system of the one or more imaging devices, and/or a positional relation between the pattern projection device and the one or more imaging devices and generate a deformation projection pattern;
• and
• a first projection pattern improvement unit configured to generate a second projection pattern obtained by improving a first projection pattern, on a basis of one or more first deformation projection patterns generated when the first projection pattern is projected from the pattern projection device toward one or more evaluation surfaces having different positions and inclinations for the pattern projection device or the one or more imaging devices.