Method for analyzing design of an integrated circuit
AssigneeImec Vzw
InventorsRyan Ryoung han Kim, Jae Uk Lee
Life of this patent
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AssigneeImec Vzw
InventorsRyan Ryoung han Kim, Jae Uk Lee
Estimating the term…
Methods and systems for analyzing design of an integrated circuit are described. An example method includes receiving a design layout for an integrated circuit and forming a plurality of images of portions of the design layout. The method also includes, for each image of a portion of the design layout, calculating a Fourier transform representation of the image and extracting values of pre-defined parameters from the Fourier transform representation. The method also includes comparing the extracted parameter values of the plurality of images to create a clustering model by unsupervised machine learning and to sort each image of a portion of the design layout into a cluster defined by the clustering model. The method also includes determining a number of images sorted into at least one cluster defined by the clustering model.
A method for analyzing design of an integrated circuit, the method comprising:
A computer program product comprising a non-transitory computer-readable medium having computer-readable instructions stored thereon that, in response to execution by a processing unit, cause the processing unit to perform operations, the instructions comprising:
A device for designing of an integrated circuit, the device comprising:
Dependencies are inferred from the claim text.