Apparatus and method for an on-chip reliability controller

A method comprising:

• performing one or more self-test/diagnostic operations on a processor;
• aggregating reliability data resulting from the self-test/diagnostic operations, the reliability data including one or more of Bias-Temperature-Instability (BTI), Electromigration (EM) damage, gate oxide (GOX) readings, or Hot Carrier Injection (HCI) readings;
• using the aggregated reliability data to perform a probability analysis to determine reliability estimates for one or more components of the processor;
• and
• adjusting one or more variables and/or circuitry related to operation of the processor responsive to the reliability estimates.

A system comprising:

• a memory to store instructions and data;
• a processor to execute the instructions and process the data;
• a graphics processor to perform graphics operations in response to graphics instructions;
• a network interface to receive and transmit data over a network;
• an interface for receiving user input from a mouse or cursor control device, the plurality of cores executing the instructions and processing the data responsive to the user input;
• the processor comprising:
• a set of one or more cores to execute instructions and process data;
• a reliability controller to perform one or more self-test/diagnostic operations, the reliability controller to aggregate reliability data resulting from the self-test/diagnostic operations, the reliability data including one or more of Bias-Temperature-Instability (BTI), Electromigration (EM) damage, gate oxide (GOX) readings, or Hot Carrier Injection (HCI) readings;
• a reliability estimator integral to the reliability controller to use the aggregated reliability data to perform a probability analysis to determine reliability estimates for one or more components of the processor;
• and
• a control unit integral to the reliability controller to adjust one or more variables and/or circuitry related to operation of the processor responsive to the reliability estimates.