Processing device configured for data integrity testing utilizing replicated test metadata file
AssigneeEMC IP Holding Company LLC
InventorsAnton Kucherov, David Meiri
Life of this patent
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AssigneeEMC IP Holding Company LLC
InventorsAnton Kucherov, David Meiri
Estimating the term…
An apparatus in one embodiment comprises at least one processing device comprising a processor coupled to a memory. The processing device is configured to schedule generation of a point-in-time replica of one or more logical storage volumes of a storage system, to generate a test metadata file for a data integrity test to be performed utilizing the point-in-time replica, and to store the test metadata file in at least one of the one or more logical storage volumes for which the point-in-time replica is to be generated. The point-in-time replica may comprise a snapshot of a replication consistency group comprising the one or more logical storage volumes of the storage system. Scheduling the generation of the point-in-time replica of the one or more logical storage volumes of the storage system illustratively comprises initiating an asynchronous replication process for a replication consistency group comprising the one or more logical storage volumes of the storage system.
An apparatus comprising:
A method comprising:
A computer program product comprising a non-transitory processor-readable storage medium having stored therein program code of one or more software programs, wherein the program code when executed by at least one processing device causes said at least one processing device:
Dependencies are inferred from the claim text.