Test apparatus for semiconductor device and method of manufacturing semiconductor device

A test apparatus for a semiconductor device, the test apparatus comprising:

• a test controller configured to output a first data signal to be transmitted to the semiconductor device and a second data signal to be transmitted to the semiconductor device;
• and
• a memory configured to store test results,
• wherein the test controller includes,
• a first input/output block configured to output a first data signal,
• a second input/output block configured to output a second data signal,
• a serializer/deserializer (SerDes) circuit configured to generate a strobe signal, and
• a skew calibration input/output block configured to receive the first data signal, the second data signal, and the strobe signal,
• wherein a frequency of the strobe signal is greater than a frequency of the first data signal and a frequency of the second data signal.

A method of manufacturing a semiconductor device using a test apparatus that includes a field programmable gate array (FPGA), the method comprising:

• manufacturing the semiconductor device;
• and
• testing the semiconductor device,
• wherein the testing includes,
• outputting a first data signal and a second data signal to test the semiconductor device, the outputting a first data signal and a second data signal performed by a first input/output block and a second input/output block included in the FPGA,
• receiving the first data signal and the second data signal, the receiving the first data signal and the second data signal performed by a skew calibration input/output block included in the FPGA,
• receiving a strobe signal that is generated by a serializer/deserializer (SerDes) circuit, the receiving the strobe signal performed by a skew calibration input/output block, and
• sampling the first data signal and the second data signal based on the strobe signal, the sampling performed by the skew calibration input/output block.