Data reading device and data reading method for design-for-testing

A data reading device for design-for-testing, comprising:

• a buffer configured to temporarily store test data;
• and
• a data serialization circuit coupled to the buffer, wherein the data serialization circuit receives a clock positive edge-triggered signal, a clock negative edge-triggered signal, a trigger mask signal, and the test data, wherein the test data comprises positive edge test data corresponding to the clock positive edge-triggered signal and negative edge test data corresponding to the clock negative edge-triggered signal,
• wherein the data serialization circuit masks one of the clock positive edge-triggered signal and the clock negative edge-triggered signal according to the trigger mask signal so as to output part of the test data,
• wherein the data serialization circuit outputs the positive edge test data when the clock negative edge-triggered signal is masked, and the data serialization circuit outputs the negative edge test data when the clock positive edge-triggered signal is masked,
• wherein one of the positive edge test data and the negative edge test data is outputted by an output terminal of the data serialization circuit to serve as an output signal of the data reading device according to the unmasked one of the clock positive edge-triggered signal and the clock negative edge-triggered signal.