Method and apparatus for integrated circuit monitoring and prevention of electromigration failure

A method of operating an apparatus including an integrated circuit and a conductor interconnecting a first element and a second element of a portion of the integrated circuit, the method comprising:

• determining a resistance of the conductor
• determining a temperature of the conductor based on the determined resistance;
• and
• adjusting at least one parameter related to the conductor in response to determining that the temperature is above a threshold, wherein the at least one parameter comprises a lifetime estimate for the conductor.

An apparatus comprising:

• an integrated circuit;
• a conductor interconnecting a first element and a second element of a portion of the integrated circuit, the conductor located in a layer separated from a substrate;
• means for determining a resistance of the conductor;
• means for determining a temperature of the conductor based on the determined resistance;
• and
• means for adjusting at least one parameter related to the conductor in response to determining that the temperature is above a threshold.