Measurement apparatus
AssigneeRohde & Schwarz GmbH & Co. KG
InventorsWerner Held, Martin Leibfritz, Marcel Ruf
Life of this patent
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Abstract
A measurement apparatus (1) comprising a high frequency measurement unit (2) adapted to measure high frequency parameters (HFP) of a device under test (DUT) connected to ports of said measurement apparatus (1) and a multimeter unit (3) adapted to measure DC characteristics parameters (DCP) of said device under test (DUT) connected via control signal lines (CL) to a control bus interface (6) of said measurement apparatus (1).
Claims13
A measurement apparatus comprising:
- a high frequency measurement unit adapted to measure high frequency parameters of a device under test;
- a test interface connected to the high frequency measurement unit and comprising test ports being connectable to the device under test to connect the high frequency measurement unit to the device under test;
- a multimeter unit adapted to measure DC characteristics of said device under test;
- a control bus interface comprising a radio frequency front end interface, said control bus interface being connected between the multimeter unit and the device under test, and being connectable via control signal lines to the device under test to connect the multimeter unit with the device under test;
- and
- a signal generator adapted to supply a stimulus signal to the device under test via the test interface, wherein the signal generator is adapted to sweep the power level of the stimulus signal over a predetermined range,
- wherein the test interface is adapted to receive the stimulus signal and to route it to the device under test;
- and
- wherein the high frequency measurement unit is adapted to determine the frequency response of the device under test.
A method for recognizing automatically a dependency between a high frequency behaviour and a low frequency behaviour of a device under test comprising the steps of:
- measuring at least one high frequency parameter of the device under test by a high frequency measurement unit of a measurement apparatus, wherein said measurement unit is connected to the device under test via a test interface comprising test ports connected to the device under test;
- measuring at least one DC characteristic parameter of the device under test simultaneously by a multimeter unit of said measurement apparatus, wherein a control bus interface is connected between said multimeter unit and the device under test, wherein said control bus interface comprises a radio frequency front end interface and is connected via control signal lines to the device under test;
- and
- calculating correlation parameters on the basis of the measured high frequency parameters and the measured DC characteristic parameters to identify a dependency between a high frequency behaviour and a low frequency behaviour of said device under test,
- wherein a stimulus signal is supplied to the device under test, wherein the power level of the stimulus signal is swept over a predetermined range, and
- wherein the frequency response of the device under test is determined by the high frequency measurement unit.
Dependencies are inferred from the claim text.