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US 10,591,512 B2Granted
Measurement apparatus
AssigneeInfineon Technologies AG
InventorsPeter Bogner, Franz Kuttner
Life of this patent
Estimating the term…
Abstract
Measurement apparatuses and methods are described. A measurement input is coupled with a first terminal of a capacitance via a first switch, and a reference voltage is coupled with the first terminal of the capacitance via a second switch. A measurement circuit is coupled to a second terminal of said capacitance.
Claims20
A device, comprising:
- an input portion including a first switch and a second switch;
- wherein the first switch is coupled between a measurement input and a first node,
- wherein the second switch is coupled between the first node and a first reference voltage, and
- wherein the first switch and the second switch are configured to switch periodically;
- a capacitive element, wherein a first terminal of the capacitive element is coupled with the first node and a second terminal of the capacitive element is coupled with a second node, and
- a measurement circuit,
- wherein a terminal of the measurement circuit is coupled with the second node,
- wherein the measurement circuit is designed to tolerate voltages with a magnitude less than a first voltage,
- wherein the first switch and the second switch are designed to tolerate voltages with a magnitude less than a second voltage, and
- wherein a magnitude of the second voltage is greater than a magnitude of the first voltage.
7 more elements
An apparatus, comprising:
- a first capacitive element,
- an input portion including a first switch and a second switch, wherein the first switch and the second switch are configured to switch periodically;
- a voltage input coupled with the first terminal of the first capacitive element via the first switch,
- a reference voltage node at a first reference voltage coupled to the first terminal of the first capacitive element via the second switch,
- a comparator, wherein a first input of the comparator is coupled with a second terminal of the first capacitive element,
- a successive approximation register that is coupled with an output of the comparator, and
- an array of second capacitive elements, wherein each one of the array of second capacitive elements has a first terminal that is coupled with the first input of the comparator and a second terminal that is selectively coupled with a second reference voltage node,
- wherein the comparator, the successive approximation register and the array of second capacitive elements are designed to tolerate voltages with a magnitude less than a first voltage,
- wherein the first switch and the second switch are designed to tolerate voltages with a magnitude less than a second voltage, and
- wherein a magnitude of the second voltage is greater than a magnitude of the first voltage.
7 more elements
A method, comprising:
- alternately applying an input voltage and a first reference voltage to a first input of a capacitor via an input portion of a device, wherein the input portion includes a first switch and a second switch, such that:
- the first switch is coupled between the input voltage and the first input of the capacitor;
- the second switch is coupled between the first reference voltage and the first input of the capacitor;
- and
- wherein the first switch and the second switch are configured to switch periodically such that when the first switch is closed the second switch is open and when the first switch is open the second switch is closed,
- coupling a second terminal of the capacitor to a comparator, and
- determining a bit value of an output signal based on an output of the comparator,
- wherein the comparator is designed to tolerate voltages with a magnitude less than a first voltage,
- wherein the first switch and the second switch are designed to tolerate voltages with a magnitude less than a second voltage, and
- wherein a magnitude of the second voltage is greater than a magnitude of the first voltage.
7 more elements
Dependencies are inferred from the claim text.