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US 10,591,510 B2Granted
Interposer with multiplexers, stimulus and control generators, and tap circuitry
AssigneeTexas Instruments Incorporated
InventorLee D. Whetsel
Life of this patent
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Abstract
The disclosure describes a novel method and apparatus for improving silicon interposers to include test circuitry for testing stacked die mounted on the interposer. The improvement allows for the stacked die to be selectively tested by an external tester or by the test circuitry included in the interposer.
Claims6
A test interposer comprising:
- (A) an interposer substrate having a first face and a second face, the interposer substrate having through input vias and through output vias, the vias having contact points on the first and second faces;
- (B) a first multiplexer having a first input coupled with a contact point on the first face, a second input, a control input, and an output coupled with a contact point on the second face;
- (C) a second multiplexer having a first input coupled with a contact point on the first face, a second input, a control input, and an output coupled with a contact point on the second face;
- (D) stimulus generator circuitry having a first control input, a second control input, and an output coupled with the second input of the first multiplexer;
- (E) control generator circuitry having a control input, a control output coupled with the first control input of the stimulus generator circuitry, a second output coupled with the second input of the second multiplexer circuitry;
- and
- (F) test access port circuitry having a test data input, a test clock input, a test mode select input, and a test data output, the test access port circuitry having control leads coupled to the first multiplexer, the second multiplexer, the stimulus generator circuitry, and the control generator circuitry.
4 more elements
Dependencies are inferred from the claim text.