Method for measuring an artefact
AssigneeRenishaw PLC
InventorsCalum Conner McLean, Ian William McLean
Life of this patent
Estimating the term…
Abstract
A method of measuring at least one point on an artefact to be inspected that is located within a positioning apparatus' measurement volume, the method comprising, obtaining at least two images of the artefact obtained from different perspectives and, based on a given nominal location of a predetermined point to be measured within said positioning apparatus' measurement volume, determine the location of said predetermined point in each of the at least two images.
Claims22
A method of inspecting an artefact that is located within a positioning apparatus measurement volume, the method comprising:
- receiving at least one image of the artefact that is located within the positioning apparatus measurement volume and which is obtained by inspecting the artefact;
- and,
- for a predetermined point on the artefact to be measured, determining the location of said predetermined point in said at least one image based on a given nominal location of the predetermined point within the positioning apparatus measurement volume, where the given nominal location is an expected location of the predetermined point within the positioning apparatus measurement volume.
An apparatus comprising at least one processor device configured to:
- (i) receive at least one image of an artefact that is located within a positioning apparatus measurement volume and which is obtained by inspecting the artefact, and, (ii) for a predetermined point on the artefact to be measured, find said predetermined point in said at least one image based on a given nominal location of the predetermined point within the positioning apparatus measurement volume, where the given nominal location is an expected location of the predetermined point within the positioning apparatus measurement volume.
Dependencies are inferred from the claim text.