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US 10,585,206 B2Granted
Method and system for a multi-view scanner
AssigneeRapiscan Systems, Inc.
InventorJoseph Bendahan
Life of this patent
Estimating the term…
Abstract
An X-ray inspection system for scanning objects is provided. The system includes a stationary X-ray source made of one or more linear modules positioned around a scanning volume, and defining sparsely positioned multiple stationary X-ray source points from which X-rays can be directed through the scanning volume. An X-ray detector array extends around the scanning volume and is arranged to detect X-rays from the source points which have passed through the scanning volume. A conveyor is arranged to convey the objects through the scanning volume and at least one processor processes the detected X-rays to produce three dimensional images of the items.
Claims18
An inspection system to scan an object, comprising:
- a conveyor to transport the object through a scanning volume for inspection;
- a first linear X-ray source module comprising a first plurality of stationary source points configured to emit X-rays and serially positioned along a length of the first linear X-ray source module;
- a second linear X-ray source module comprising a second plurality of stationary source points configured to emit X-rays and serially positioned along a length of the second linear X-ray source module, wherein the second linear X-ray source module is perpendicularly positioned relative to the first linear X-ray source module;
- a third linear X-ray source module comprising a third plurality of stationary source points configured to emit X-rays and serially positioned along a length of the third linear X-ray source module, wherein the third linear X-ray source module is perpendicularly positioned relative to the first linear X-ray source module and is positioned in parallel to the second linear X-ray source module;
- a fourth linear X-ray source module comprising a fourth plurality of stationary source points configured to emit X-rays and serially positioned along a length of the fourth linear X-ray source module, wherein the fourth linear X-ray source module is perpendicularly positioned relative to the second and third linear X-ray source modules and is positioned in parallel to the first linear X-ray source module, wherein the first, second, third, and fourth linear X-ray source modules define the scanning volume, and wherein each source point of the first, second, third and fourth plurality of stationary source points has a field of view and wherein the field of view is smaller for source points closer to an end of the first, second, third, or fourth linear X-ray source module compared to source points closer to a center of the first, second, third, or fourth linear X-ray source module;
- a detector array having a plurality of detector modules arranged around the scanning volume to detect X-rays transmitted through the scanning volume and generate scan data;
- a controller configured to activate and deactivate each of the source points of the first, second, third, and fourth plurality of stationary source points in a predefined sequence;
- and
- a processor for processing the scan data to reconstruct three dimensional images of the object.
6 more elements
An inspection system to scan an object, comprising:
- a conveyor to transport the object through a scanning volume for inspection;
- a multi-focus X-ray source comprising a plurality of X-ray source points sparsely arranged in one or more linear source modules around the scanning volume, wherein a beam angle of X-rays formed by each of the plurality of X-ray source points relative to the object for inspection varies across the plurality of X-ray source points;
- a detector array positioned between the multi-focus X-ray source and the scanning volume, wherein the detector array comprises a plurality of detector modules arranged in a non-circular geometry around the scanning volume to detect X-rays transmitted through the object during scanning and is configured to generate scan data, and wherein a first plane of the X-ray source and a second plane of the detector array are offset with respect to one another in a direction substantially parallel to a direction of movement of the object;
- and
- a processor configured to analyze the scan data and reconstruct image data of the object being inspected.
2 more elements
An inspection system to scan an object, comprising:
- a conveyor to transport the object through a scanning volume for inspection;
- a plurality of X-ray source points arranged in:
- a first X-ray source assembly comprising two linear X-ray source modules positioned on first and second adjacent sides of the scanning volume to form a substantially right angle between the two source modules, wherein the two linear X-ray source modules comprise a first plurality and a second plurality of stationary source points respectively, configured to emit X-rays and serially positioned along a length of the linear X-ray source module;
- and
- a second X-ray source assembly comprising two linear X-ray source modules positioned on first and fourth adjacent sides of the scanning volume to form a substantially right angle between the two source modules, wherein the two linear X-ray source modules comprise a third plurality and fourth plurality of stationary source points respectively, configured to emit X-rays and serially positioned along a length of the linear X-ray source module;
- a detector array having:
- a first detector assembly of two detector modules positioned on third and fourth adjacent sides of the scanning volume to form a substantially right angle between the two detector modules, such that the form of the first detector assembly inversely corresponds to the form of the first source assembly, and wherein said first source assembly and said first detector assembly lie on a first plane;
- a second detector assembly of two detector modules positioned on second and third adjacent sides of the scanning volume to form a substantially right angle between the two detector modules, such that the form of the second detector assembly inversely corresponds to the form of the second source assembly, and wherein said second source assembly and said second detector assembly lie on a second plane, and wherein said first plane is offset from said second plane in a direction of conveyance of the object;
- a controller configured to activate and deactivate each of the source points of the first, second, third, and fourth plurality of stationary source points in a predefined sequence;
- and
- a processor for processing the scan data to reconstruct three dimensional images of the object.
8 more elements
Dependencies are inferred from the claim text.