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US 10,568,163 B2Granted
Methods of fault detection for multiplexed heater array
AssigneeLam Research Corporation
InventorHarmeet Singh
Life of this patent
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Abstract
Described herein is a method of detecting fault conditions in a multiplexed multi-heater-zone heating plate for a substrate support assembly used to support a semiconductor substrate in a semiconductor processing apparatus.
Claims14
A method of fault detection in a substrate support assembly in a semiconductor processing apparatus, the method comprising:
- arranging a semiconductor substrate on the substrate support assembly;
- supplying power to a plurality of heater zones of a heating plate of the substrate support assembly via a plurality of power supply lines such that power is supplied to each of the heater zones independently of power supplied to others of the heater zones;
- obtaining a measured total heating power of the power provided by the plurality of heater zones by independently determining a respective heating power provided by each of the plurality of heater zones and calculating a sum of the respective heating powers;
- comparing the measured total heating power to a pre-established total heating power of the plurality of heater zones;
- and
- if the measured total heating power deviates from the pre-established total heating power by a pre-determined margin, triggering an alarm signal;
- wherein the measured total heating power is obtained by measuring a voltage V across each of the one or more heater zones, measuring a current I flowing through each of the one or more heater zones, multiplying V by I, and adding V·I of each of the one or more heater zones.
4 more elements
Dependencies are inferred from the claim text.