Electronic circuit for single-event latch-up detection and protection

A method of single-event latch-up (SEL) detection and protection for a target integrated circuit (IC) comprising:

• a) detecting an absolute load current (i);
• b) calculating a threshold current (ith) by monitoring an actual load current to determine a range indicative of normal circuit behavior and determining the threshold current (ith) based on an expected maximum value for the normal operating range;
• c) comparing the absolute load current (i) with the threshold current (ith);
• d) detecting a rate of change of load current (di/dt);
• e) calculating a threshold current change rate (di/dt)th by monitoring an actual rate of change of load current to determine a range indicative of normal circuit behavior and determining the threshold current change rate (di/dt)th based on an expected maximum value for the normal operating range;
• f) comparing the rate of change of load current (di/dt) with the threshold current change rate (di/dt)th;
• and
• g) triggering a power shut-down to the target IC if at least one of the following conditions are satisfied:
• the absolute load current (i) exceeds the threshold current (ith) or the rate of change of load current (di/dt) exceeds the threshold current change rate (di/dt)th.