Apparatus and method for measuring waveform of light wave based on ionization yield modulation

A light wave measurement apparatus comprising:

• a pulse separation unit configured to separate an input light wave into a fundamental pulse having a first electric field strength and a signal pulse having a second electric field strength, the first electric field strength being stronger than the second electric field strength, the first electric field strength and the second electric field strength having a certain ratio therebetween;
• a time delay adjustment unit configured to adjust a time delay between the fundamental pulse and the signal pulse;
• an ionization yield measurement unit configured to measure an ionization yield generated in an ionization material which is focused by the fundamental pulse and the signal pulse, and obtain an ionization yield modulation changed by the signal pulse as a function of the time delay;
• and
• a waveform calculation unit configured to calculate a waveform of the input light wave based on the ionization yield modulation.

A light wave measurement apparatus comprising:

• a pulse separation unit configured to,
• separate an input light wave into a fundamental pulse and a signal pulse, and
• focus the fundamental pulse and the signal pulse on a first ionization material;
• a time delay adjustment unit configured to adjust a time delay between the fundamental pulse and the signal pulse;
• a first ionization yield measurement unit configured to measure a first ionization yield in the first ionization material which is focused by the fundamental pulse and the signal pulse;
• a focusing unit configured to focus only the fundamental pulse on a second ionization material;
• and
• a second ionization yield measurement unit configured to measure a second ionization yield in the second ionization material which is focused by only the fundamental pulse.