Manufacturing process data collection and analytics
AssigneeSap SE
InventorsStephan Meier, Robert Noce, Navdeep Raj Ganesh, Ge Cao, Matthias Weigold, Philipp Raub
Life of this patent
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AssigneeSap SE
InventorsStephan Meier, Robert Noce, Navdeep Raj Ganesh, Ge Cao, Matthias Weigold, Philipp Raub
Estimating the term…
Techniques for comparing two or more sessions of a manufacturing process are described. In one example, a particular metric associated with execution of a manufacturing process is identified, the particular metric evaluated in a plurality of manufacturing process sessions for at least one manufacturing process. A particular session particular session from the plurality of manufacturing process sessions is selected as a baseline session, wherein at least a portion of the remaining plurality of manufacturing process sessions are to be compared to the baseline session. In a primary portion of a presentation area, a visualization of the values of the identified metric associated with the particular session are presented. In a secondary portion of the presentation area, visualizations of the values of the identified metric associated with at least a portion of the other manufacturing process sessions from the plurality of sessions is presented.
A computer-implemented method performed by at least one processor executing instructions, the method comprising:
A system comprising:
A non-transitory computer-readable medium storing instructions which, when executed, cause at least one processor to perform operations comprising:
Dependencies are inferred from the claim text.