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US 10,552,252 B2Granted
Patterned bit in error measurement apparatus and method
AssigneeSeagate Technology LLC
InventorsJeon Seokhun, Oh Sungchul, Jung Pil-Woo, Jeong Seungyoul
Life of this patent
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Abstract
A method includes detecting different data patterns in data read from a portion of a non-transitory data storage medium. Bit errors in the different data patterns are then determined. Further, bits in error for a total number of bits in each of the different data patterns are calculated from the determined bit errors in the different data patterns.
Claims19
A method comprising:
- establishing different data pattern types;
- detecting different data patterns in data read from a portion of a non-transitory data storage medium that fall into the different data pattern types;
- determining bit errors in each of the different data patterns;
- grouping subsets of the different data patterns according to the different data pattern types;
- separately determining pattern-dependent bits in error for a total number of bits in each of the different grouped subsets of the different data patterns from the determined bit errors in the different data patterns by employing a separate multiplexer and accumulator combination for each of the different established data pattern types;
- and
- generating a total pattern-dependent bits in error by summing the pattern-dependent bits in error for each of the different grouped subsets of the different data patterns.
4 more elements
A data storage device comprising:
- a non-transitory data storage medium;
- and
- a read element configured to read data stored on the data storage medium;
- and
- a read channel, communicatively coupled to the read element, wherein the read channel is configured to:
- detect different data patterns, in data read from a portion of the data storage medium, that fall into different established data pattern types;
- determine bit errors in the different data patterns;
- group subsets of the different data patterns according to the different data pattern types;
- separately determine pattern-dependent bits in error for a total number of bits in each of the different grouped subsets of the different data patterns from the determined bit errors in the different data patterns by employing a separate multiplexer and accumulator combination for each of the different established data pattern types;
- and
- generate a total pattern-dependent bits in error by summing pattern-dependent bits in error for each of the different grouped subsets of the different data patterns.
8 more elements
A method comprising:
- writing different predetermined data patterns to different portions of a segment of a non-transitory data storage medium;
- reading the different predetermined data patterns from the different portions of the segment of the data storage medium to obtain read data patterns;
- determining bit errors in the read data patterns;
- and
- calculating a segment-level bit in error value for the segment from the determined bit errors by:
- producing in a pattern detector a plurality of pattern flags, each pattern flag identifying one of the read data patterns;
- supplying the pattern flag for each of the different read data patterns to a plurality of multiplexers, each pattern flag activating a one of the plurality of multiplexers;
- accumulating the bits in error from each multiplexer using a plurality of accumulators, an accumulator coupled to each multiplexer;
- and
- summing the bits in error from the plurality of accumulators.
7 more elements
Dependencies are inferred from the claim text.