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US 10,551,428 B2Granted
Systems and methods for storing frequency information for system calibration/trimming
AssigneeMicrochip Technology Incorporated
InventorsAjay Kumar, Hyunsoo Yeom
Life of this patent
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Abstract
Embodiments of the present disclosure include a microcontroller with a frequency test circuit, a device-under-test (DUT) input, and a calculation engine circuit. The calculation engine circuit is configured to compare a measured frequency from the frequency test circuit measured from the DUT input to a reference frequency stored in memory, and, based on the comparison, adjust frequency of the DUT generating the DUT input.
Claims22
An integrated circuit, comprising:
- a frequency test circuit;
- a device-under-test (DUT) having an input;
- and
- a calculation engine circuit configured to:
- compare a measured frequency from the frequency test circuit measured from the DUT input to a reference frequency value stored in memory;
- and
- based on the comparison, adjust a frequency of the DUT generating the DUT input;
- wherein the frequency test circuit comprises a test resistor to which a test current can be applied and the calculation engine circuit is further configured to adjust frequency of the DUT based upon a predefined stress ratio stored in memory reflecting a status of the integrated circuit before and after packaging;
- wherein to calculate said predefined stress ratio the calculation engine circuit is further configured to:
- measure and store a first digital code for a desired frequency at a first temperature before packaging and a second digital code corresponding to a product of the test current and a resistance of the test resistor at the first temperature after packaging;
- and
- obtain the predefined stress ratio by dividing the first digital code by the second digital code or vice versa.
9 more elements
A microcontroller, comprising:
- a frequency test circuit comprising a test resistor to which a test current can be applied;
- a device-under-test (DUT) having an input;
- and
- a calculation engine circuit configured to:
- compare a measured frequency from the frequency test circuit measured from the DUT input to a reference frequency value stored in memory;
- and
- based on the comparison, adjust frequency of the DUT generating the DUT input;
- wherein the calculation engine circuit is further configured to adjust frequency of the DUT based upon a stress ratio stored in memory reflecting a status of the microcontroller before and after packaging;
- wherein to calculate said stress ratio the calculation engine circuit is further configured to:
- measure and store a first digital code for a desired frequency at a first temperature before packaging and a second digital code corresponding to a product of the test current and a resistance of the test resistor at the first temperature after packaging;
- and
- obtain the stress ratio by dividing the first digital code by the second digital code or vice versa.
9 more elements
A method, comprising:
- selecting an input mode of an integrated circuit, the integrated circuit operable in the input mode to store reference frequencies and wherein the integrated circuit comprises a test resistor to which a test current can be applied;
- applying a reference frequency to a frequency test circuit of the integrated circuit;
- measuring a resulting frequency from the frequency test circuit;
- and
- storing a first digital code representing the resulting frequency at a first temperature to memory of the integrated circuit before packaging;
- adjusting frequency of an integrated oscillator based upon a predefined stress ratio stored in memory reflecting a status of the integrated circuit before and after packaging;
- wherein the predefined stress ration is calculated by:
- applying the test current to the test resistor;
- measuring and storing a second digital code corresponding to a product of the test current and a resistance of the test resistor at the first temperature after packaging;
- and
- obtaining the predefined stress ratio by dividing the first digital code by the second digital code or vice versa.
8 more elements
Dependencies are inferred from the claim text.