CMM probe path controller and method
AssigneeHexagon Metrology, Inc.
InventorsPaul Racine, Scott Carlson
Life of this patent
Estimating the term…
Abstract
A method and apparatus for measuring an object using a CMM receives nominal geometry data relating to the object, and produces a set-up path based on the received nominal geometry data. The method also conducts a set-up measurement of the object using a CMM probe. The CMM probe conducts the set-up measurement by following the set-up path, and the set-up measurement of the object produces scan path information. The method generates a scan path using the scan path information, and controls the CMM probe to conduct a fine measurement of the object by causing the CMM probe to move along the generated scan path.
Claims23
A method of measuring a workpiece using a CMM, the method comprising:
- receiving idealized geometric data from a computer representation of the workpiece, wherein the idealized geometric data is a representation of the manufacturing specifications of the workpiece;
- calculating a first scan path using the idealized geometric data;
- conducting a first coarser scan of the workpiece along the first scan path using a CMM probe, the first scan producing measured workpiece geometric information;
- calculating a second scan path of the workpiece using the measured workpiece geometric information from the first coarser scan;
- and
- conducting a second finer scan of the workpiece along the second scan path using the CMM probe, the second finer scan producing fine measurement information,
- the first coarser scan beginning before the second finer scan begins.
A CMM comprising:
- a base configured to support an object;
- a CMM probe;
- a control system operatively coupled with the CMM probe, the control system being configured to cause the CMM probe to conduct a geometric coarse measurement of the workpiece, the CMM probe conducting the coarse measurement by following a first scan path that is based on idealized geometric data of the workpiece, the coarse measurement of the workpiece producing scan path information, the control system further being configured to generate a second scan path using the scan path information and control the CMM probe to conduct a measurement of the workpiece by causing the CMM probe to move along the generated second scan path, wherein the idealized geometric data is a representation of the manufacturing specifications of the workpiece.
A computer program product for use on a computer system for measuring a workpiece using a CMM, the computer program product comprising a tangible, non-transient computer usable medium having computer readable program code thereon, the computer readable program code comprising:
- program code for receiving idealized geometric data from a computer representation of the workpiece, wherein the idealized geometric data is a representation of the manufacturing specifications of the workpiece;
- program code for producing a coarser set-up path based on the received idealized geometric data;
- program code for conducting a geometric set-up measurement of the workpiece using a CMM probe by following the coarser set-up path, the set-up measurement of the workpiece producing scan path information;
- program code for generating a finer scan path using the scan path information from the set-up measurement;
- and
- program code for controlling the CMM probe to conduct a fine measurement of the workpiece by causing the CMM probe to move along the generated finer scan path.
Dependencies are inferred from the claim text.