Printed repassivation for wafer chip scale packaging
AssigneeTexas Instruments Incorporated
InventorsDaiki Komatsu, Makoto Shibuya, Yi Yan, Hau Nguyen, Luu Thanh Nguyen, Anindya Poddar
Life of this patent
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Abstract
Described examples provide integrated circuits and methods, including forming a conductive seed layer at least partially above a conductive feature of a wafer, forming a conductive structure on at least a portion of the conductive seed layer, performing a printing process that forms a polymer material on a side of the wafer proximate a side of the conductive structure, curing the deposited polymer material, and attaching a solder ball structure to a side of the conductive structure.
Claims26
A method, comprising:
- forming a conductive seed layer at least partially above a conductive feature of a wafer;
- forming a conductive structure on at least a portion of the conductive seed layer;
- performing a printing process that forms a polymer material on a side of the wafer proximate a side of the conductive structure;
- curing the deposited polymer material;
- and
- attaching a solder ball structure to a side of the conductive structure.
A device, comprising:
- an electronic component disposed on or in a semiconductor substrate;
- a metallization structure disposed over the semiconductor substrate, including a conductive feature;
- a conductive contact structure electrically coupled with the conductive feature, the conductive contact structure extending outward from a side of the metallization structure;
- a printed polymer material disposed on the side of the metallization structure proximate a side of the conductive contact structure;
- and
- a solder ball structure connected to the conductive structure.
An integrated circuit (IC), comprising:
- a die, including:
- a semiconductor substrate, including an electronic component, and
- a metallization structure disposed over the semiconductor substrate, the metallization structure including a conductive feature;
- a conductive contact structure electrically coupled with the conductive feature, the conductive contact structure extending outward from a side of the metallization structure;
- a printed polymer material disposed on the side of the metallization structure proximate a side of the conductive contact structure;
- and
- a package structure that encloses the die and provides electrical connection to the conductive contact structure.
An integrated circuit (IC), comprising:
- a die, including:
- a semiconductor substrate, including an electronic component, and
- a metallization structure disposed over the semiconductor substrate, the metallization structure including a conductive feature;
- a conductive contact structure electrically coupled with the conductive feature, the conductive contact structure extending outward from a side of the metallization structure;
- a printed polymer material disposed on the side of the metallization structure proximate a side of the conductive contact structure;
- and
- a package structure that encloses the die and provides electrical connection to the conductive contact structure, wherein the package structure includes a substrate, having a first side with a conductive pad soldered to the conductive contact structure, a second side with a conductive pad electrically connected to the conductive pad of the first side, and a solder ball soldered to the conductive pad of the second side.
An integrated circuit (IC), comprising:
- a die, including:
- a semiconductor substrate, including an electronic component, and
- a metallization structure disposed over the semiconductor substrate, the metallization structure including a conductive feature;
- a conductive contact structure electrically coupled with the conductive feature, the conductive contact structure extending outward from a side of the metallization structure;
- a printed polymer material disposed on the side of the metallization structure proximate a side of the conductive contact structure;
- and
- a package structure that encloses the die and provides electrical connection to the conductive contact structure, wherein the package structure includes;
- a conductive metal lead frame structure, including a lead soldered to the conductive contact structure;
- and
- a ceramic structure or molded material that encapsulates the die, the conductive contact structure, the printed polymer material, and a portion of the conductive metal lead frame structure.
A method for fabricating an integrated circuit (IC), the method comprising:
- forming a conductive seed layer at least partially above a conductive feature of a wafer;
- forming a conductive structure on at least a portion of the conductive seed layer;
- performing a printing process that forms a polymer material on a side of the wafer proximate a side of the conductive structure;
- curing the deposited polymer material;
- attaching a solder ball structure to a side of the conductive structure;
- separating a die from the wafer;
- and
- creating a package structure package structure that encloses the die and provides electrical connection to the conductive contact structure.
A method for fabricating an integrated circuit (IC), the method comprising:
- forming a conductive seed layer at least partially above a conductive feature of a wafer;
- forming a conductive structure on at least a portion of the conductive seed layer;
- performing a printing process that forms a polymer material on a side of the wafer proximate a side of the conductive structure, including performing multiple printing passes to deposit multiple layers of the polymer material proximate the side of the conductive structure;
- curing the deposited polymer material;
- attaching a solder ball structure to a side of the conductive structure;
- separating a die from the wafer;
- and
- creating a package structure package structure that encloses the die and provides electrical connection to the conductive contact structure.
A method for fabricating an integrated circuit (IC), the method comprising:
- forming a conductive seed layer at least partially above a conductive feature of a wafer;
- forming a conductive structure on at least a portion of the conductive seed layer;
- performing a printing process that forms a polymer material on a side of the wafer proximate a side of the conductive structure;
- heating the wafer while performing the printing process to at least partially cure the polymer material;
- attaching a solder ball structure to a side of the conductive structure;
- separating a die from the wafer;
- and
- creating a package structure that encloses the die and provides electrical connection to the conductive contact structure.
A method for fabricating an integrated circuit (IC), the method comprising:
- forming a conductive seed layer at least partially above a conductive feature of a wafer;
- forming a conductive structure on at least a portion of the conductive seed layer;
- performing a printing process that forms a polymer material on a side of the wafer proximate a side of the conductive structure;
- exposing the polymer material to ultraviolet light while performing the printing process to at least partially cure the polymer material;
- attaching a solder ball structure to a side of the conductive structure;
- separating a die from the wafer;
- and
- creating a package structure package structure that encloses the die and provides electrical connection to the conductive contact structure.
Dependencies are inferred from the claim text.