Ion analyzer
AssigneeShimadzu Corporation
InventorsHiroyuki Miura, Hideaki Izumi, Kiyoshi Ogawa
Life of this patent
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AssigneeShimadzu Corporation
InventorsHiroyuki Miura, Hideaki Izumi, Kiyoshi Ogawa
Estimating the term…
A microchannel plate (MCP) 41 in an ion detection section 4 multiplies electrons. An anode 42 detects those electrons and produces a current signal. An amplifier 44 converts this signal into a voltage signal. A low-pass filter 5A acting as a smoothing section 5 is located at the output end of the amplifier 44. A waveform-shaping time adjuster 6 adjusts the time constant of the low-pass filter 5A beforehand according to the response time of the MCP 41, mass-to-charge ratio of an ion species to be subjected to the measurement, and duration of the spread of the ion species which depends on device-specific parameters. A plurality of peaks which sequentially appear in the detection signal corresponding to one ion species are thereby smoothed into a single broad peak. Thus, the distinguishability between signal waves and noise components is improved.
An ion analyzer having an ion detection section for generating a detection signal corresponding an amount of incident ion, the ion analyzer comprising:
Dependencies are inferred from the claim text.